Nearly two years ago, we introduced Test Combinations Generator (TCG).Because of its widespead popularity, we made TCG available for GUI testing in Hewlett Packard EnterpriseUnified Functional Testing (UFT) 14.00. For this blog, we will drill down into the benefits of TCG and how to use GUI testing to generate large data sets intelligently.
Challenges of Test Data
One of the biggest challenges engineers face with their automation efforts is creating, manipulating, and managing test data. According to market research, engineers spend 30-60 percent of their time just tinkering with data. To reduce these efforts, engineers need ways to:
Remove testing bottlenecks by creating the right data at the right time without cutting corners under pressure
Easily generate synthetic test data that is customized to meet the specific needs of individual test cases
Overcome test demands without having to use sensitive data
Test Combinations Generator in UFT
With the induction of TCG in UFT 14.00, engineers can now utilize its IDE's Global Data Sheet to easily create the desired data coverage when working on GUI tests, thereby giving them the power to:
Generate multiple parameter values using built-in parameter data or regular expressions
Customize data values to meet specific requirements
Create dataset combinations using Happy / Error paths and algorithms (Linear, Pairwise, Triplewise)
While this blog covers a subset of UFT’s functionality, we hope it was enough to convince you to give it a try. More details about this and other new features will be covered in upcoming blogs and webinars.
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